ESAW Speckle Pattern Interferometry (MP-7595)
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Product Description
ESAW Speckle Pattern Interferometry (MP-7595)
Speckle Pattern Interferometry (SPI) determines the
difference between two small deformation states of
the same inspected object. Speckle-pattern ineterferometry shows a fringe pattern, which can be
interpreted as contour lines of the same state of
deformation. The distance between two fringes
corresponds to half the laser wavelength. Therefore
SPI allows sensitive and non-contact detection of
defects. This instrument has been developed by ISRO
Satellite center, Bangalore for NDT applications with
Hollmattric Company. It makes use of speckle pattern
interferometry along with CCD imaging techniques
and image processing software for studying the static
and dynamic conditions of the test objects. Hollmattric
company has a technology transfer agreement with
ISRO Satellite center for manufacturing and marketing
this system with the permission of Hollmarc Company
we have given this equipment in our catalogue. The
unit consists of opto-mechanical and optical
components similar to those used for holography,
assembled on a breadboard. He-Ne laser is used as
light source. Instead of holographic plates, CCD
camera is used for recording fringes.